Cullen School of Engineering

Location

Dept. of Electrical & Computer Engineering
N308 Engineering Building 1
Houston, Texas 77004-4005
Phone: 713-743-4400
Fax: 713-743-4444
Department: ece [at] egr [dot] uh [dot] edu
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Faculty

Dr. Wanda Zagozdzon-Wosik

Associate Professor

N 308 Engineering Building 1

Houston, Texas 77204-4005

Tel: 713-743-4427 | Fax: 713-743-4444

Email: wwosik [at] uh [dot] edu

Education

  • MS, Warsaw University of Technology, Electronics Department, Warsaw, Poland
  • PhD, Warsaw University of Technology, Electronics Department, Warsaw, Poland

Professional Experience

Until 1986

The Institute of Electron Technology CEMI (Research and Development Center for Semiconductors)

1986-Present

Joined UH Cullen College of Engineering as a visiting professor, now an associate professor


Awards and Honors

Research

Research Interests

  • Microelectronics: Semiconductor Integrated Circuit Processing Technology and Electron Devices, Micro- and Nonoelectromechnical Systems (MEMS/NEMS), and BioMEMS for Biological Samples at Cellular/Subcellular Levels and Nanoparticles.


Presentations

Selected Publications

Selected Publications

  • C Darne, L Xie, W Zagozdzon-Wosik, H K. Schmidt, and J Wosik, Microwave properties of single-walled carbon nanotubes films below percolation threshold , Appl. Phys. Lett. 94, 233112, 2009

  • D. Padmaraj, W. Zagozdzon-Wosik, L-M Xie, V. G. Hadjiev, P. Cherukuri and J. Wosik, Parallel and orthogonal E-field alignment of single-walled carbon nanotubes by ac dielectrophoresis, Nanotechnology, 20, 035201, 2009

  • D. Padmaraj, W. Zagozdzon-Wosik, R. Pande, J.H. Miller, L-M Xie, J. Wosik, "Dielectrophoresis and Comsol Simulation of Cell Entrapment At Electrodes", Nanotechnology 2009, vol.1, pp. 460 - 463, ISBN: 978-1-4398-1782-7, 2009

  • D. Padmaraj, W. Zagozdzon-Wosik, Lei-Ming Xie, D. Pijanowka, J.H. Miller, P. Grabiec, J. Wosik, BioMEMS for Mitochondria Medicine, Nanotechnology 2009, vol.1 , pp. 464 - 467, ISBN: 978-1-4398-1782-7, 2009

  • C. Darne, L.-M. Xie, D. Padmaraj, P. Cherukuri W. Zagozdzon-Wosik, and J. Wosik, "Resonant and Broadband Microwave Permittivity Measurements of Single-walled Carbon Nanotubes," Nanotubes and Related Nanostructures, edited by Yoke Khin Yap, Mater. Res. Soc. Symp. Proc. Volume 1057E, 1057-II15-61 Warrendale, PA, 2008.

  • D. Padmaraj, W. Zagozdzon-Wosik, J. H. Miller, Joe Charlson, and L. Trombetta, "Nanogap Capacitors Used for Impedance Characterization of Living Cells", Proceedings "Integrated Nanosensors" of Material Research Soc., Vol. 952, 0952-F10-15, 2007

  • W. Zagozdzon-Wosik, I. Rusakova, C. Darne,Z.-H. Zhang, P. van der Heide,and P. Majhi, Microstructure and Electrical Properties of Diborides after Rapid Thermal Annealing, Journal of Microscopy, 223, 3, 227-230, 2006.

  • Qingkai Yu, Guoting Qin, Chinmay Darne, Chengzhi Cai, Wanda Wosik, and Shin-Shem Pei, Fabrication of short and thin silicon cantilevers for AFM with SOI wafers, Sensors and Actuators, 126-2, 369, 2006.

  • W. Zagozdzon-Wosik, C. Darne, D. Radhakrishnan, I. Rusakova, P. van der Heide, Z.-H. Zhang, J. Bennett, L. Trombetta, P. Majhi, and D, Matron, "Applications of metallic borides for gate electrodes in CMOS integrated circuits, Rev. Adv. Mater. Sci. 8, Vol. 8, No. 2, pp. 185-194, 2004.

  • R. Ranjit, W. Zagozdzon-Wosik, I. Rusakova, P. van der Heide, Z.-H. Zhang, J. Bennett, and D. Marton. "Formation of contacts and integration with shallow junctions using diborides of Ti, Zr and Hf", Rev. Adv. Mater. Sci. 8, No. 2, pp. 176-184, 2004.

  • Zagozdzon-Wosik, W., R. Ranjit, I. Rusakova, P. van der Heide, Z. Zhang, and J. Bennett, "RTP of titanium boride for applications in from end processing", Proc. of IEEE 11th International Conf. on Advanced Thermal Proc. of Semiconductors, RTP 2003, Charlson, SC, pp. 209-213, Sept. 2003.

  • W. Zagozdzon-Wosik, R. Ranjit, D. B Ravindranath, Z. Zhang, J. Charlson, I. Rusakova, and P. van der Heide, L. Larson, J. Bennett, R. Tichy, and M. Beebe, "Conductive Borides Used for Junction Formation and Integration with Contacts in Deep 0.1µm MOSFETs", IEEE 19th International Conf. on Advanced Thermal Proc. of Semiconductors, RTP 2002, Vancouver, Canada, pp. 137-142, Sept. 2002.

  • W. Zagozdzon-Wosik, L. Shao, M. Menon, E. Arroyo-Cadtelazo, I. Rusakova, X. Wang, P. Van der Heide, J. Liu, W.K. Chu and J. Bennet, "Device and material issues related to integration of junctions with contacts in deep 0.1 µm MOSFETs, 9th Intern. Conf. On Advanced Thermal Processing of semiconductors, RTP 2001, Eds., DeWitt et al., pp. 82-86, 2001.

  • W. Zagozdzon-Wosik, Semiconductor Doping and Diffusion, Electrical and Electronics Engineering Encyclopedia, ed. J. Webster, J. Wiley&Sons, Inc., Vol. 19, pp. 17-29, 1999.


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